OPTIKA B-510MET Trinocular Metallurgical Microscope with Incident IlluminationOPTIKA
MATERIAL SCIENCE / METALLOGRAPHY
Reflected light microscopy is the method for observation of specimens that remain opaque even when ground to a thickness of few microns. The range of specimens falling into this category is incredibly wide and includes most metals, ores, ceramics, many polymers, semiconductors (unprocessed silicon, wafers, and integrated circuits), coal, plastics, paint, paper, wood, leather, glass inclusions, and a wide variety of specific materials.
IMPROVING THE MOST IMPORTANT ASPECTS OF MICROSCOPY EXPERIENCE
TOP IMAGES COME FROM IMPRESSIVE OPTICS
LABORATORY GRADE OPTICS
CONTRAST ENHANCING METHODS WITH OBLIQUE ILLUMINATION AND DIAPHRAGMS
Oblique illumination, also known as simple darkfield, is considered an alternative to the darkfield technique except that, instead of using dedicated darkfield objectives, the system uses the same brightfield objectives and the specimen is lighted from a movable "curtain" that has the task to modulate the oblique light; doing this, the light comes from only a different perspective generating a pseudo-darkfield effect.
BEST RESOLUTION, COLOR AND CONTRAST WITH KÃ–HLER ILLUMINATION
B-510 Series is equipped with KÃ¶hler which optimizes the microscope optical path to produce high sample contrast and homogeneous bright light, reducing image artifacts, reflections and glares.
In this way, you will achieve the full control over the illumination aperture to reach the best compromise between resolution and contrast and for some enhancements on the depth of field.
X-LED3 AND X-LED8 EXCLUSIVE LIGHTING SOURCE
Achieve bright images, improved color fidelity, pure white color temperature, incredibly low energy consumption and longer lifespan with the unique X-LED technology, able to double the light intensity for incomparable performance. Relevant money and energy saving thanks to the incredibly low energy consumption which allows you to cut the electricity bills by 90%!
X-LED3 is on transmitted light (when included); X-LED8 is on reflected light.
SAFE AND CONVENIENT OPERATIONS
The rackless stage has been designed with a belt-driven mechanism that allows a smooth movement without any protruding part. This design gives you a more compact solution and lowers any risk of injury after accidentally hitting the rack with your hands.
A NEW FRONTIER IN ERGONOMIC PRODUCT DESIGN
ELEGANT DESIGN WITHSTANDING EVERYDAY USE
EASY TO CARRY, LIGHT, STEADY
EXTRA LARGE SPECIMEN VIEW (22 MM FIELD NUMBER)
Enjoy a 22 mm field of view ensures you to gain peripheral view and comfort when observing the specimen. This means more efficient inspections and allows a natural and easy view, particularly needed in a laboratory environment.
|Observation Methods||Incident light only: Brightfield, Simple Polarization, Oblique Illumination.|
|Head||Trinocular, 30Â° inclined, rotatable 360Â°, Â±5 dioptric adjustment on left eyepiece, interpupillary adjustment 50 - 75 mm, Fixed photo port, 50/50 ratio.|
|Eyepieces||Plan wide field, PL 10x/22, high eyepoint|
|Nosepiece||Quintuple revolving nosepiece, rotation on ball bearings|
|Objectives||IOS W-PLAN MET 5x, 10x, 20x, 50x|
|Stage||Double layer with mechanical sliding stage, size 233 x 147 mm, X-Y movement range 78 x 54 mm. Belt-drive in X direction. Vernier scale on two axes, accuracy 0.1 mm|
|Focusing||Coaxial coarse and fine focusing mechanism (graduated, 0.002 mm) with upper stop. Adjustable tension of coarse focusing knob.|
|Incident Illumination||High-efficiency X-LED8 (8 W, comparable to a 100 W halogen bulb), manual brightness control. KÃ¶hler illumination system with field and aperture diaphragms, both centrable. Oblique illumination system for relief contrast.|
|Warranty||Ten (10) Years mechanical and optical parts Two (2) Years electrical|
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